In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

1:14

Performance of Computed Tomography (CT) Scan

3:07

Micro Preparation

5:06

Light Microscopy (LM) Measurement Setup

6:15

Light Microscopy Characterization

7:16

Scanning Electron Microscopy (SEM) Analysis

8:32

Results: Comprehensive Micro-characterization of an Active Light Emitting Diode

9:49

Conclusion