JoVE Journal
Engineering
This content is Open Access.
16.6K Views
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10:25 min
•
December 20th, 2016
DOI :
December 20th, 2016
•0:05
Title
0:59
Equipment and Substrate Preparation
2:39
Cantilever and Tip Preparation
3:22
Set-up of AFM Cell and Cantilever Calibration
4:27
Approach and Initial Check of the Sample
6:31
High-resolution Imaging
8:09
Results: Sub-nanometer Resolution Imaging of Soft and Stiff Samples
9:18
Conclusion
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