Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

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26.4K Views

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14:11 min

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March 29th, 2016

DOI :

10.3791/53452-v

March 29th, 2016

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Markus Wilde¹, Satoshi Ohno¹, Shohei Ogura¹, Katsuyuki Fukutani¹, Hiroyuki Matsuzaki²

¹Institute of Industrial Science, The University of Tokyo, ²Micro Analysis Laboratory, Tandem accelerator, The University Museum, The University of Tokyo

Podsumowanie

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Keywords Hydrogen Concentration

Nuclear Reaction Analysis

Depth Profiling

Surface And Interface Layers

Bulk Materials

Hydrogen Storage

Fuel Cells

Hydrogenation Catalysts

Semiconductor Technology

Palladium

Low Energy Electron Diffraction

Auger Electron Spectroscopy

Rozdziały w tym wideo

0:05

Title

1:29

Single Crystal Surface Preparation for Nuclear Reaction Analysis (NRA) in Ultra-high Vacuum

8:07

Surface Hydrogen Nuclear Reaction Analysis Measurements

9:24

Bulk and Interface Hydrogen Nuclear Reaction Analysis: Preparation and Measurement

11:02

Results: Nuclear Reaction Analysis Hydrogen Depth Profiles for Single Crystal Palladium and from Silicon Dioxide Films on Silicon

12:50

Conclusion

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