All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

0:52

Initial Setup of Microscope and Experiments

2:05

Preparation of the H-Si(100)-(2x1) Reconstruction

4:20

Assessing the Quality of the Pump-probe Pulses at the Tunnel Junction

6:32

Experiment 1: Time-resolved Scanning Tunneling Spectroscopy

7:55

Experiment 2: Time-resolved STM Measurements of Relaxation Dynamics

8:47

Experiment 3: Time-resolved STM Measurements of Excitation Dynamics

9:27

Results: Investigation of Single Dopant Change Dynamics

10:43

Conclusion