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Scanning Electron Microscopic Evaluation of Surface Defects of Remover Retreatment File After Single and Multiple Uses
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03:07 min
October 11th, 2024
DOI :
10.3791/67329-v
Here, we present a protocol for evaluating the surface characteristics of endodontic retreatment files after repeated use in retreatment procedures, utilizing scanning electron microscopy to identify and analyze potential surface defects.
0:00
Introduction
0:52
Retreatment Procedure for Remover Rotary Nickel-Titanium (NiTi) Files and Their Analysis
2:02
Representative Results
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