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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

8.0K Views

05:57 min

April 1st, 2020

DOI :

10.3791/60269-v

April 1st, 2020


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SiN Integrated Optical Phased Arrays

Hoofdstukken in deze video

0:05

Introduction

0:36

Optical Coupling: Fiber Alignment

1:25

Optical Coupling: Optical Phase Array (OPA) Output Imaging

2:14

Beam Optimization and Steering

4:05

Beam Divergence Measurement Imaging

4:30

Results: Representative Silicon Nitride (SiN) Integrated OPA Characterization

5:20

Conclusion

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