二氧化钒原子层沉积与温度依赖性光学模型

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Title

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Atomic Layer Deposition (ALD) of Amorphous Vanadium Dioxide (VO2 ) on Sapphire Substrates

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Annealing Amorphous VO2 Thin Films

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Characterization of VO2 Films by Raman Spectroscopy

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Characterization of VO2 Films by X-Ray Photoelectron Spectroscopy (XPS)

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Morphological Characterization by Atomic Force Microscopy (AFM)

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Results: Characterization of Amorphousand Crystalline VO2 Films

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Conclusion

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